Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Electrical and structural properties of oxygen-precipitation induced extended defects in silicon
Publication:
Electrical and structural properties of oxygen-precipitation induced extended defects in silicon
Copy permalink
Date
1996
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
1100.pdf
165.32 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Simoen, Eddy
;
Vanhellemont, Jan
Journal
Abstract
Description
Metrics
Views
1795
since deposited on 2021-09-29
Acq. date: 2025-12-17
Citations
Metrics
Views
1795
since deposited on 2021-09-29
Acq. date: 2025-12-17
Citations