Publication:
Electrical and structural properties of oxygen-precipitation induced extended defects in silicon
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1800 since deposited on 2021-09-29
2last month
2last week
Acq. date: 2026-08-10
Citations
Statistics
Views
1800 since deposited on 2021-09-29
2last month
2last week
Acq. date: 2026-08-10
Citations