Publication:
Tunneling 1/fg noise in 5nm HfO2/2.1 nm SiO2 gate stack n-MOSFETs
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1901 since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations
Metrics
Views
1901 since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations