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Measurement and statistical analysis of single trap current-voltage characteristics in ultrathin SiON
Publication:
Measurement and statistical analysis of single trap current-voltage characteristics in ultrathin SiON
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Date
2005-04
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Govoreanu, Bogdan
;
Kaczer, Ben
;
Van Houdt, Jan
;
Groeseneken, Guido
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1825
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations
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Views
1825
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations