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Erratum : "Substrate bias effect on the capture kinetics of random telegraph signals in submicron p-channel silicon metal-oxide-semiconductor transistors" [Appl. Phys. Lett. 66, 598 (1995)]
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Erratum : "Substrate bias effect on the capture kinetics of random telegraph signals in submicron p-channel silicon metal-oxide-semiconductor transistors" [Appl. Phys. Lett. 66, 598 (1995)]
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1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, C.
Journal
Appl. Phys. Lett.
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1935
since deposited on 2021-09-29
3
last month
Acq. date: 2025-12-17
Citations
Metrics
Views
1935
since deposited on 2021-09-29
3
last month
Acq. date: 2025-12-17
Citations