Publication:
Continuous improvements of defectivity rates in immersion photolithography via functionalized membranes in point-of-use photochemical filtration
| dc.contributor.author | D'Urzo, Lucia | |
| dc.contributor.author | Bayana, Hareen | |
| dc.contributor.author | Vandereyken, Jelle | |
| dc.contributor.author | Foubert, Philippe | |
| dc.contributor.author | Wu, Aiwen | |
| dc.contributor.author | Jaber, Jad | |
| dc.contributor.author | Hamzik, James | |
| dc.contributor.imecauthor | D'Urzo, Lucia | |
| dc.contributor.imecauthor | Bayana, Hareen | |
| dc.contributor.imecauthor | Vandereyken, Jelle | |
| dc.contributor.imecauthor | Foubert, Philippe | |
| dc.date.accessioned | 2021-10-24T04:30:20Z | |
| dc.date.available | 2021-10-24T04:30:20Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2017 | |
| dc.identifier.doi | 10.1117/12.2258582 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28289 | |
| dc.source.beginpage | 101462A | |
| dc.source.conference | Advances in Patterning Materials and Processes XXXIV | |
| dc.source.conferencedate | 26/02/2017 | |
| dc.source.conferencelocation | San Jose, CA USA | |
| dc.title | Continuous improvements of defectivity rates in immersion photolithography via functionalized membranes in point-of-use photochemical filtration | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |