Publication:

Metamodelling of Noise to Image Classification Performance

Date

2023
Journal article
https://doi.org/10.1109/ACCESS.2023.3273530
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dc.contributor.authorDe Hoog, Jens
dc.contributor.authorAnwar, Ali
dc.contributor.authorReiter, Phil
dc.contributor.authorMercelis, Siegfried
dc.contributor.authorHellinckx, Peter
dc.contributor.imecauthorDe Hoog, Jens
dc.contributor.imecauthorAnwar, Ali
dc.contributor.imecauthorReiter, Phil
dc.contributor.imecauthorMercelis, Siegfried
dc.contributor.orcidimecde Hoog, Jens::0000-0003-0032-2029
dc.contributor.orcidimecAnwar, Ali::0000-0002-5523-0634
dc.contributor.orcidimecMercelis, Siegfried::0000-0001-9355-6566
dc.contributor.orcidimecReiter, Phil::0000-0002-2548-7172
dc.date.accessioned2023-08-18T10:33:15Z
dc.date.available2023-07-16T17:16:05Z
dc.date.available2023-08-18T10:33:15Z
dc.date.embargo2023-05-22
dc.date.issued2023
dc.description.wosFundingTextThis work was supported in part by the Flemish Government under the "Onderzoeksprogramma Artificifile Intelligentie (AI) Vlaanderen"Program, in part by the Shared Situational Awareness for Vessels Project (SSAVE), and in part by the Flanders Innovation and Entrepreneurship (VLAIO) and the Blue Cluster.
dc.identifier.doi10.1109/ACCESS.2023.3273530
dc.identifier.issn2169-3536
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42167
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage47994
dc.source.endpage48006
dc.source.issuena
dc.source.journalIEEE ACCESS
dc.source.numberofpages13
dc.source.volume11
dc.subject.keywordsEFFICIENT BENCHMARKING
dc.subject.keywordsMETA-FEATURES
dc.title

Metamodelling of Noise to Image Classification Performance

dc.typeJournal article
dspace.entity.typePublication
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