Publication:
NBTI lifetime prediction and kinetics at operation bias based on ultrafast pulse measurement
Date
| dc.contributor.author | Ji, Zhigang | |
| dc.contributor.author | Lin, L. | |
| dc.contributor.author | Zhang, Jian Fu | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-18T17:24:10Z | |
| dc.date.available | 2021-10-18T17:24:10Z | |
| dc.date.issued | 2010 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17324 | |
| dc.identifier.url | http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5350729 | |
| dc.source.beginpage | 228 | |
| dc.source.endpage | 237 | |
| dc.source.issue | 1 | |
| dc.source.journal | IEEE Transactions on Electron Devices | |
| dc.source.volume | 57 | |
| dc.title | NBTI lifetime prediction and kinetics at operation bias based on ultrafast pulse measurement | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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