Publication:

Investigation of Recombination Mechanisms in Electronic Devices Using Bias-dependent Admittance Spectroscopy Applied to CIGS Solar Cells

Date

2025-AUG 5
Journal article
https://doi.org/10.1021/acsami.5c09671
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dc.contributor.authorBrammertz, Guy
dc.contributor.authorScaffidi, Romain
dc.contributor.authorHamtaei, Sarallah
dc.contributor.authorParion, Jonathan
dc.contributor.authorde Wild, Jessica
dc.contributor.authorBirant, Gizem
dc.contributor.authorOris, Tim
dc.contributor.authorMeuris, Marc
dc.contributor.authorvan der Vleuten, Maarten
dc.contributor.authorSimor, Marcel
dc.contributor.authorGrynko, Dmytro
dc.contributor.authorNazarov, Alexei
dc.contributor.authorBlomme, Ruben
dc.contributor.authorPoonkottil, Nithin
dc.contributor.authorDendooven, Jolien
dc.contributor.authorFlandre, Denis
dc.contributor.authorAernouts, Tom
dc.contributor.authorPoortmans, Jef
dc.contributor.authorVermang, Bart
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorScaffidi, Romain
dc.contributor.imecauthorHamtaei, Sarallah
dc.contributor.imecauthorParion, Jonathan
dc.contributor.imecauthorde Wild, Jessica
dc.contributor.imecauthorBirant, Gizem
dc.contributor.imecauthorOris, Tim
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorAernouts, Tom
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorVermang, Bart
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecScaffidi, Romain::0000-0001-9766-1857
dc.contributor.orcidimecHamtaei, Sarallah::0000-0002-5458-7068
dc.contributor.orcidimecParion, Jonathan::0000-0002-8695-917X
dc.contributor.orcidimecde Wild, Jessica::0000-0003-2291-4674
dc.contributor.orcidimecBirant, Gizem::0000-0003-0496-8150
dc.contributor.orcidimecOris, Tim::0000-0003-0007-4918
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.contributor.orcidimecAernouts, Tom::0000-0002-3004-6080
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.contributor.orcidimecVermang, Bart::0000-0003-2669-2087
dc.date.accessioned2025-08-17T03:57:14Z
dc.date.available2025-08-17T03:57:14Z
dc.date.issued2025-AUG 5
dc.description.wosFundingTextWe would like to acknowledge Avancis GmbH for providing samples to perform admittance measurements. This work has received funding from the European Union H2020 Framework Program under Grant Agreement no. 101075626 (SITA) and under the FWO program ENGAGED (G0A1623N). R.S. acknowledges financial support by the Flanders Research Foundation (FWO)-fundamental research doctoral grant 1178022N. S.H. acknowledges financial support by the Flanders Research Foundation (FWO)-strategic basic research doctoral grant 1S31922N. Jo.Pa. acknowledges financial support by the Flanders Research Foundation (FWO)-strategic basic research doctoral grant 1S01525N. Gi.Bi. acknowledges financial support by the Flanders Research Foundation (FWO)-the Junior Postdoctoral Fellowship grant 1219423N. D.G. and A.N. acknowledge financial support by the Program Science for Peace and Security (NATO project SPS G5853).
dc.identifier.doi10.1021/acsami.5c09671
dc.identifier.issn1944-8244
dc.identifier.pmidMEDLINE:40762395
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/46086
dc.publisherAMER CHEMICAL SOC
dc.source.journalACS APPLIED MATERIALS & INTERFACES
dc.source.numberofpages11
dc.subject.keywordsINTERFACE PROPERTIES
dc.subject.keywordsTHIN-FILMS
dc.subject.keywordsCAPACITANCE
dc.subject.keywordsDEFECTS
dc.subject.keywordsSTATES
dc.subject.keywordsLAYER
dc.subject.keywordsBULK
dc.subject.keywordsSIMULATION
dc.title

Investigation of Recombination Mechanisms in Electronic Devices Using Bias-dependent Admittance Spectroscopy Applied to CIGS Solar Cells

dc.typeJournal article
dspace.entity.typePublication
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