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Analysis of UTBOX-1T DRAM memory cell at high temperatures

Date

2011
Proceedings Paper
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dc.contributor.authorAlmeida, L.M.
dc.contributor.authorSasaki, K.R.A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-19T12:28:51Z
dc.date.available2021-10-19T12:28:51Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18469
dc.source.beginpage53
dc.source.conference26th Symposium on Microelectronics Technology and Devices - SBMicro
dc.source.conferencedate30/08/2011
dc.source.conferencelocationJoao Pessoa Brazil
dc.source.endpage60
dc.title

Analysis of UTBOX-1T DRAM memory cell at high temperatures

dc.typeProceedings paper
dspace.entity.typePublication
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