Publication:
A MOS capacitor model for ultra-thin 2D semiconductors: the impact of interface defects and channel resistance
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1986 since deposited on 2021-10-28
2last month
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Acq. date: 2026-02-26
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Statistics
Views
1986 since deposited on 2021-10-28
2last month
1last week
Acq. date: 2026-02-26
Citations