Publication:
A MOS capacitor model for ultra-thin 2D semiconductors: the impact of interface defects and channel resistance
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1987 since deposited on 2021-10-28
1last month
Acq. date: 2026-04-07
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Statistics
Views
1987 since deposited on 2021-10-28
1last month
Acq. date: 2026-04-07
Citations