Publication:

C-SMART: A preprocessor for neural network performance and reliability under radiation

Date

2025-OCT
Journal article
https://doi.org/10.1016/j.microrel.2025.115859
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dc.contributor.authorRajappa, Anuj Justus
dc.contributor.authorReiter, Philippe
dc.contributor.authorRech, Paolo
dc.contributor.authorMercelis, Siegfried
dc.contributor.authorFamaey, Jeroen
dc.contributor.imecauthorRajappa, Anuj Justus
dc.contributor.imecauthorReiter, Philippe
dc.contributor.imecauthorMercelis, Siegfried
dc.contributor.imecauthorFamaey, Jeroen
dc.contributor.orcidimecMercelis, Siegfried::0000-0001-9355-6566
dc.contributor.orcidimecFamaey, Jeroen::0000-0002-3587-1354
dc.date.accessioned2025-08-03T03:58:49Z
dc.date.available2025-08-03T03:58:49Z
dc.date.issued2025-OCT
dc.identifier.doi10.1016/j.microrel.2025.115859
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/46022
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.journalMICROELECTRONICS RELIABILITY
dc.source.numberofpages11
dc.source.volume173
dc.subject.keywordsMODULAR REDUNDANCY
dc.subject.keywordsPRECISION
dc.subject.keywordsIMPACT
dc.subject.keywordsEDGE
dc.subject.keywordsSYSTEMS
dc.subject.keywordsMEMORY
dc.title

C-SMART: A preprocessor for neural network performance and reliability under radiation

dc.typeJournal article
dspace.entity.typePublication
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