Publication:
An investigation of the electron tunneling leakage current through ultrathin oxides/high-k gate stacks at inversion conditions
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1870 since deposited on 2021-10-15
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Acq. date: 2026-08-04
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Statistics
Views
1870 since deposited on 2021-10-15
2last month
2last week
Acq. date: 2026-08-04
Citations