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Materials and defect aspects of III-V and III-N devices for high-speed analog/RF applications

Date

2020
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorHsu, Brent
dc.contributor.authorYu, Hao
dc.contributor.authorWang, Hongyue
dc.contributor.authorZhao, Ming
dc.contributor.authorTakakura, Kenichiro
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorParvais, Bertrand
dc.contributor.authorWaldron, Niamh
dc.contributor.authorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHsu, Brent
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorWang, Hongyue
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorTakakura, Kenichiro
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHsu, Brent::0000-0003-0823-6088
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-29T04:09:45Z
dc.date.available2021-10-29T04:09:45Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35948
dc.source.beginpage316
dc.source.conference2020 IEEE 15th International Conference on Solid-State and Integrated Circuits Technology - ICSICT 2020
dc.source.conferencedate3/11/2020
dc.source.conferencelocationKunming (online) Chima
dc.source.endpage319
dc.title

Materials and defect aspects of III-V and III-N devices for high-speed analog/RF applications

dc.typeProceedings paper
dspace.entity.typePublication
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