Publication:
Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers
Date
| dc.contributor.author | Papameletis, Christos | |
| dc.contributor.author | Keller, Brion | |
| dc.contributor.author | Chickermane, Vivek | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Hamdioui, Said | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-21T10:44:12Z | |
| dc.date.available | 2021-10-21T10:44:12Z | |
| dc.date.issued | 2013-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22904 | |
| dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6569350 | |
| dc.source.beginpage | 15 | |
| dc.source.conference | IEEE European Test Symposium - ETS | |
| dc.source.conferencedate | 27/05/2013 | |
| dc.source.conferencelocation | Avignon France | |
| dc.source.endpage | 20 | |
| dc.title | Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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