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Self-heating induced soft degradation of the early voltage in SiGe: C HBTs

Date

2003
Journal article
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dc.contributor.authorXu, Mingwei
dc.contributor.authorSibaja-Hernandez, Arturo
dc.contributor.authorSadovnikov, A.
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorSibaja-Hernandez, Arturo
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-15T07:53:02Z
dc.date.available2021-10-15T07:53:02Z
dc.date.embargo9999-12-31
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8418
dc.source.beginpage646
dc.source.endpage648
dc.source.issue10
dc.source.journalIEEE Electron Device Letters
dc.source.volume24
dc.title

Self-heating induced soft degradation of the early voltage in SiGe: C HBTs

dc.typeJournal article
dspace.entity.typePublication
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