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Physical characterization of Cu2ZnGeSe4 thin films from annealing of Cu-Zn-Ge precursor layers
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Physical characterization of Cu2ZnGeSe4 thin films from annealing of Cu-Zn-Ge precursor layers
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Buffiere, Marie
;
ElAnzeery, Hossam
;
Oueslati, Souhaib
;
Ben Messaoud, Khaled
;
Brammertz, Guy
;
Meuris, Marc
;
Poortmans, Jef
Journal
Thin Solid Films
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1919
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations
Metrics
Views
1919
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations