Publication:

Degradation of high-resistivity float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

Date

2009
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorRafi, J.M.
dc.contributor.authorBoulord, C.
dc.contributor.authorHayama, K.
dc.contributor.authorOhyama, H.
dc.contributor.authorCampabadal, F.
dc.contributor.authorPellegrini, G.
dc.contributor.authorLozano, M.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-18T02:03:50Z
dc.date.available2021-10-18T02:03:50Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.issn0168-9002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16074
dc.source.beginpage258
dc.source.endpage261
dc.source.journalNuclear Instruments and Methods in Physics Research A
dc.source.volume604
dc.title

Degradation of high-resistivity float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
19741.pdf
Size:
226.36 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles