Publication:

Insight into negative and positive bias temperature instability (N/PBTI) mechanism

Date

2012

Journal article

Simple item page Full metadata Statistics

Author(s)

;

;

Aoulaiche, Marc

;

;

Roussel, Philippe

;

Kauerauf, Thomas

;

Degraeve, Robin

;

;

Ragnarsson, Lars-Ake

;

Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Metrics

1885 since deposited on 2021-10-20

Acq. date: 2025-12-16