Publication:

Insight into negative and positive bias temperature instability (N/PBTI) mechanism

Date

2012

Journal article

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Author(s)

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Aoulaiche, Marc

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Roussel, Philippe

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Kauerauf, Thomas

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Degraeve, Robin

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Ragnarsson, Lars-Ake

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Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Statistics

1889 since deposited on 2021-10-20

Acq. date: 2026-02-24