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Assessment of critical Co electromigration parameters

 
dc.contributor.authorVarela Pedreira, Olalla
dc.contributor.authorLofrano, Melina
dc.contributor.authorZahedmanesh, Houman
dc.contributor.authorRoussel, Philippe
dc.contributor.authorvan der Veen, Marleen
dc.contributor.authorSimons, Veerle
dc.contributor.authorChery, Emmanuel
dc.contributor.authorCiofi, Ivan
dc.contributor.authorCroes, Kristof
dc.contributor.imecauthorVarela Pedreira, Olalla
dc.contributor.imecauthorLofrano, Melina
dc.contributor.imecauthorZahedmanesh, Houman
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorvan der Veen, Marleen
dc.contributor.imecauthorSimons, Veerle
dc.contributor.imecauthorChery, Emmanuel
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecVarela Pedreira, Olalla::0000-0002-2987-1972
dc.contributor.orcidimecZahedmanesh, Houman::0000-0002-0290-691X
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecvan der Veen, Marleen::0000-0002-9402-8922
dc.contributor.orcidimecSimons, Veerle::0000-0001-5714-955X
dc.contributor.orcidimecChery, Emmanuel::0000-0002-2526-3873
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.date.accessioned2023-04-25T10:27:13Z
dc.date.available2023-02-27T03:28:06Z
dc.date.available2023-04-25T10:27:13Z
dc.date.issued2022
dc.identifier.doi10.1109/IRPS48227.2022.9764427
dc.identifier.eisbn978-1-6654-7950-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41160
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
dc.source.journalna
dc.source.numberofpages7
dc.title

Assessment of critical Co electromigration parameters

dc.typeProceedings paper
dspace.entity.typePublication
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