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Gate current random telegraph noise and single defect conduction
Publication:
Gate current random telegraph noise and single defect conduction
Date
2013
Journal article
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26407.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Toledano Luque, Maria
;
Goes, Wolfgang
;
Grasser, Tibor
;
Groeseneken, Guido
Journal
Microelectronic Engineering
Abstract
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1946
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations
Metrics
Views
1946
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations