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Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperatures
Publication:
Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperatures
Date
1998
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Blauwe, Jan
;
Wellekens, Dirk
;
Groeseneken, Guido
;
Haspeslagh, Luc
;
Van Houdt, Jan
;
Deferm, Ludo
;
Maes, Herman
Journal
IEEE Trans. Electron Devices
Abstract
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Views
1964
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1964
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations