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Conference contributions
N7 middle of line etch challenges and solutions
Publication:
N7 middle of line etch challenges and solutions
Date
2015
Meeting abstract
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31547.pdf
89.53 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kunnen, Eddy
;
Brouri, Mohand
;
Demuynck, Steven
;
Versluijs, Janko
;
Boemmels, Juergen
;
Ryckaert, Julien
Journal
Abstract
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1943
since deposited on 2021-10-22
Acq. date: 2025-10-22
Citations
Metrics
Views
1943
since deposited on 2021-10-22
Acq. date: 2025-10-22
Citations