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Reliable assessment of uncertainty for appliance recognition in NILM using conformal prediction
Publication:
Reliable assessment of uncertainty for appliance recognition in NILM using conformal prediction
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Date
2023
Journal article
https://doi.org/10.1049/ell2.12860
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Werthen Brabants, Lorin
;
Dhaene, Tom
;
Deschrijver, Dirk
Journal
ELECTRONICS LETTERS
Abstract
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98
since deposited on 2023-10-18
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last month
Acq. date: 2025-12-15
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971
since deposited on 2023-10-18
Acq. date: 2025-12-15
Citations
Metrics
Downloads
98
since deposited on 2023-10-18
7
last month
Acq. date: 2025-12-15
Views
971
since deposited on 2023-10-18
Acq. date: 2025-12-15
Citations