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Single exposure EUV patterning for BEOL metal layers on the imec iN7 platform
Publication:
Single exposure EUV patterning for BEOL metal layers on the imec iN7 platform
Date
2017
Proceedings Paper
https://doi.org/10.1117/12.2258005
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Blanco, Victor
;
Bekaert, Joost
;
Mao, Ming
;
Kutrzeba Kotowska, Bogumila
;
Lariviere, Stephane
;
Ciofi, Ivan
;
Baert, Rogier
;
Kim, Ryan Ryoung han
;
Gallagher, Emily
;
Hendrickx, Eric
;
Tan, Ling Ee
;
Gillijns, Werner
;
Trivkovic, Darko
;
Leray, Philippe
;
Halder, Sandip
;
Gallagher, Matt
;
Lazzarino, Frederic
;
Paolillo, Sara
;
Wan, Danny
;
Mallik, Arindam
;
Sherazi, Yasser
;
McIntyre, Greg
;
Dusa, Mircea
;
Rusu, Paul
;
Hollink, Thijs
;
Fliervoet, Timon
;
Wittebrood, Friso
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1967
since deposited on 2021-10-24
Acq. date: 2025-10-27
Citations
Metrics
Views
1967
since deposited on 2021-10-24
Acq. date: 2025-10-27
Citations