Publication:

Smart-array for pipelined BTI characterization

Date

 
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorSimicic, Marko
dc.contributor.authorWeckx, Pieter
dc.contributor.authorParvais, Bertrand
dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVerkest, Diederik
dc.contributor.authorThean, Aaron
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-22T21:58:54Z
dc.date.available2021-10-22T21:58:54Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25782
dc.identifier.urlhttp://www.iirw.org/fileadmin/user_upload/2015_9_18_IIRW_2015_TPC_Schedule.pdf
dc.source.conferenceIEEE International Integrated Reliability Workshop -IIRW
dc.source.conferencedate11/10/2015
dc.source.conferencelocationFallen Leaf Lake, CA USA
dc.title

Smart-array for pipelined BTI characterization

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections: