Publication:

Intrinsic switching variability in HfO2 RRAM: A theoretical and experimental study

Date

2013
Proceedings Paper
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dc.contributor.authorFantini, Andrea
dc.contributor.authorGoux, Ludovic
dc.contributor.authorDegraeve, Robin
dc.contributor.authorWouters, Dirk
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorChen, Yangyin
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorJurczak, Gosia
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-21T07:34:29Z
dc.date.available2021-10-21T07:34:29Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22332
dc.source.beginpage30
dc.source.conference5th IEEE International Memory Workshop - IMW
dc.source.conferencedate26/05/2013
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage33
dc.title

Intrinsic switching variability in HfO2 RRAM: A theoretical and experimental study

dc.typeProceedings paper
dspace.entity.typePublication
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