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Electron valence-band tunneling-induced Lorentzian noise in deep submicron silicon-on-insulator metal-oxide-semiconductor field-effect tranistors
Publication:
Electron valence-band tunneling-induced Lorentzian noise in deep submicron silicon-on-insulator metal-oxide-semiconductor field-effect tranistors
Date
2003-10
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.B.
;
Petricuk, M.V.
;
Garbar, P.
;
Mercha, Abdelkarim
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal of Applied Physics
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1869
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Views
1869
since deposited on 2021-10-15
1
last month
1
last week
Acq. date: 2025-12-08
Citations