Publication:

Bayesian Active Learning for Radiation Pattern Sampling Over Cylindrical Surfaces

Date

2022
Journal article
https://doi.org/10.1109/TEMC.2022.3172483
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dc.contributor.authorGarbuglia, Federico
dc.contributor.authorClaeys, Tim
dc.contributor.authorCouckuyt, Ivo
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorDhaene, Tom
dc.contributor.imecauthorGarbuglia, Federico
dc.contributor.imecauthorCouckuyt, Ivo
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidimecGarbuglia, Federico::0000-0002-1917-1921
dc.contributor.orcidimecCouckuyt, Ivo::0000-0002-9524-4205
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.accessioned2023-01-05T10:14:53Z
dc.date.available2022-06-03T02:21:06Z
dc.date.available2022-06-03T09:20:02Z
dc.date.available2023-01-05T10:14:53Z
dc.date.embargo2022-10-01
dc.date.issued2022
dc.description.wosFundingTextThis work was supported by the Flemish Government (AI Research Program).
dc.identifier.doi10.1109/TEMC.2022.3172483
dc.identifier.issn0018-9375
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39921
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage1391
dc.source.endpage1398
dc.source.issue5
dc.source.journalIEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
dc.source.numberofpages8
dc.source.volume64
dc.subject.keywordsSEQUENTIAL DESIGN STRATEGY
dc.title

Bayesian Active Learning for Radiation Pattern Sampling Over Cylindrical Surfaces

dc.typeJournal article
dspace.entity.typePublication
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