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TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM
Publication:
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM
Date
2011
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Barozzi, Mario
;
Iacob, E
;
van den Berg, J.A.
;
Reading, M.A.
;
Adelmann, Christoph
;
Popovici, Mihaela Ioana
;
Tielens, Hilde
;
Bersani, M.
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1910
since deposited on 2021-10-19
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Acq. date: 2025-10-25
Citations
Metrics
Views
1910
since deposited on 2021-10-19
408
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations