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Systematic study of interfacial reactions induced by metal electrodes in high-k/InGaAs gate stacks
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Systematic study of interfacial reactions induced by metal electrodes in high-k/InGaAs gate stacks
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yoshida, Shinichi
;
Lin, Dennis
;
Vais, Abhitosh
;
Alian, AliReza
;
Franco, Jacopo
;
El Kazzi, Salim
;
Mols, Yves
;
Miyanami, Yuki
;
Nakazawa, Masashi
;
Collaert, Nadine
;
Watanabe, H
;
Thean, Aaron
Journal
Applied Physics Letters
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1935
since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations
Metrics
Views
1935
since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations