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Process Window Enhancement of Via Holes for Fine Pitch RDL by Design Optimization

 
dc.contributor.authorSlabbekoorn, John
dc.contributor.imecauthorSlabbekoorn, John
dc.contributor.orcidimecPhommahaxay, Alain::0000-0001-8672-2386
dc.date.accessioned2022-09-20T12:21:33Z
dc.date.available2021-11-02T16:04:46Z
dc.date.available2022-09-20T12:21:33Z
dc.date.issued2020-06
dc.identifier.doi10.1109/ECTC32862.2020.00179
dc.identifier.eisbn978-1-7281-6180-8
dc.identifier.issn0569-5503
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38156
dc.publisherIEEE COMPUTER SOC
dc.source.beginpage1114
dc.source.conference70th IEEE Electronic Components and Technology Conference (ECTC)
dc.source.conferencedateJUN 03-30, 2020
dc.source.conferencelocationamerica
dc.source.endpage1119
dc.source.journalectc
dc.source.numberofpages6
dc.title

Process Window Enhancement of Via Holes for Fine Pitch RDL by Design Optimization

dc.typeProceedings paper
dspace.entity.typePublication
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