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Conference contributions
The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETs
Publication:
The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETs
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Date
2005
Proceedings Paper
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10595.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Camillo, L.M.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
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1825
since deposited on 2021-10-16
Acq. date: 2025-12-12
Citations
Metrics
Views
1825
since deposited on 2021-10-16
Acq. date: 2025-12-12
Citations