Publication:

Origin of substrate hole current after gate oxide breakdown

Date

2002
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorRasras, Mahmoud
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.accessioned2021-10-14T22:54:17Z
dc.date.available2021-10-14T22:54:17Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6752
dc.source.beginpage2155
dc.source.endpage2160
dc.source.issue4
dc.source.journalJournal of Applied Physics
dc.source.volume91
dc.title

Origin of substrate hole current after gate oxide breakdown

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles