Publication:
Process-oriented modelling of stresses and mechanical confinement in advanced nano-interconnects; implications for electromigration
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1847 since deposited on 2021-10-24
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Acq. date: 2026-10-05
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Statistics
Views
1847 since deposited on 2021-10-24
1last month
1last week
Acq. date: 2026-10-05
Citations