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Cluster optimization to improve total CD control as an enabler for double patterning
Publication:
Cluster optimization to improve total CD control as an enabler for double patterning
Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Laidler, David
;
D'have, Koen
;
Rosslee, Craig
;
Tedeschi, Len
Journal
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1896
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations
Metrics
Views
1896
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations