Impact of the NW-TFET diameter on the efficiency and the intrinsic voltage gain from a conduction regime perspective

dc.contributor.author	Mendes Bordallo, Ciao Cesar
dc.contributor.author	Sivieri, V.B.
dc.contributor.author	Martino, Joao A.
dc.contributor.author	Agopian, Paula G. A.
dc.contributor.author	Rooyackers, Rita
dc.contributor.author	Vandooren, Anne
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Thean, Aaron
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Vandooren, Anne
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.imecauthor	Thean, Aaron
dc.contributor.orcidimec	Vandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-23T12:45:08Z
dc.date.available	2021-10-23T12:45:08Z
dc.date.embargo	9999-12-31
dc.date.issued	2016
dc.identifier.issn	0018-9383
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/26997
dc.identifier.url	http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7467453
dc.source.beginpage	2930
dc.source.endpage	2935
dc.source.issue	7
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	63
dc.title	Impact of the NW-TFET diameter on the efficiency and the intrinsic voltage gain from a conduction regime perspective
dc.type	Journal article
dspace.entity.type	Publication
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