Publication:
A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies
| dc.contributor.author | Saraza-Canflanca, P. | |
| dc.contributor.author | Carrasco-Lopez, H. | |
| dc.contributor.author | Santana-Andreo, A. | |
| dc.contributor.author | Diaz Fortuny, Javier | |
| dc.contributor.author | Castro-Lopez, R. | |
| dc.contributor.author | Roca, E. | |
| dc.contributor.author | Fernandez, F. V. | |
| dc.contributor.imecauthor | Diaz Fortuny, Javier | |
| dc.contributor.orcidimec | Diaz Fortuny, Javier::0000-0002-8186-071X | |
| dc.date.accessioned | 2023-04-25T09:36:57Z | |
| dc.date.available | 2023-02-27T03:29:05Z | |
| dc.date.available | 2023-04-25T09:36:57Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This work was supported by AEI under Project PID2019103869RB-C31/AEI/10.13039/501100011033, and by Junta de Andalucia and P.O. FEDER under project US-1380876. Andres Santana Andreo acknowledges MICINN for supporting his research activity through the predoctoral grant PRE-2020-093167. | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764587 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41197 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| dc.source.numberofpages | 5 | |
| dc.subject.keywords | TIME-DEPENDENT VARIABILITY | |
| dc.subject.keywords | HOT-CARRIER DEGRADATION | |
| dc.subject.keywords | BTI | |
| dc.title | A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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