Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Capacitance-voltage (CV) characterization of GaAs-oxide interfaces
Publication:
Capacitance-voltage (CV) characterization of GaAs-oxide interfaces
Date
2008
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Brammertz, Guy
;
Martens, Koen
;
Lin, Dennis
;
Merckling, Clement
;
Penaud, Julien
;
Adelmann, Christoph
;
Sioncke, Sonja
;
Wang, Wei-E
;
Caymax, Matty
;
Meuris, Marc
;
Heyns, Marc
Journal
Abstract
Description
Metrics
Views
1979
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1979
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations