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Origin of NBTI variability in deeply scaled pFETs
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Origin of NBTI variability in deeply scaled pFETs
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Date
2010-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Grasser, Tibor
;
Roussel, Philippe
;
Franco, Jacopo
;
Degraeve, Robin
;
Ragnarsson, Lars-Ake
;
Simoen, Eddy
;
Groeseneken, Guido
;
Reisinger, Hans
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1936
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Acq. date: 2025-12-11
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Metrics
Views
1936
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-11
Citations