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Two-dimensional carrier profiling of semiconductor structures with nanometer resolution
Publication:
Two-dimensional carrier profiling of semiconductor structures with nanometer resolution
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Date
1998-05
Dissertation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Peter
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Abstract
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1977
since deposited on 2021-09-30
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Acq. date: 2025-12-16
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Metrics
Views
1977
since deposited on 2021-09-30
5
last month
2
last week
Acq. date: 2025-12-16
Citations