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Double hard mask strategy for patterning 0.186 micron2 SRAM cells using FinFET technology
Publication:
Double hard mask strategy for patterning 0.186 micron2 SRAM cells using FinFET technology
Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Demand, Marc
;
Veloso, Anabela
;
Brus, Stephan
;
Delvaux, Christie
;
De Backer, Johan
;
Ercken, Monique
;
Boullart, Werner
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Abstract
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1922
since deposited on 2021-10-17
Acq. date: 2025-10-28
Citations
Metrics
Views
1922
since deposited on 2021-10-17
Acq. date: 2025-10-28
Citations