Publication:

Linear kink effect induced drain current hysteresis in ultra thin gate oxide FD-SOI MOSFETs

Date

2004
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorHayama, K.
dc.contributor.authorOhyama, H.
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-15T13:42:51Z
dc.date.available2021-10-15T13:42:51Z
dc.date.embargo9999-12-31
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8999
dc.source.beginpage59
dc.source.conferenceProceedings European Workshop on Ultimate Integration of Silicon - ULIS
dc.source.conferencedate11/03/2004
dc.source.conferencelocationLeuven Belgium
dc.source.endpage62
dc.title

Linear kink effect induced drain current hysteresis in ultra thin gate oxide FD-SOI MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
9574.pdf
Size:
314.11 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions