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Two-dimensional analysis of Al and B back surface field using scanning
Publication:
Two-dimensional analysis of Al and B back surface field using scanning
Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eyben, Pierre
;
Werner, Thilo
;
Hantschel, Thomas
;
Schulze, Andreas
;
Lorenz, Anne
;
John, Joachim
;
Horzel, Jörg
;
Vandervorst, Wilfried
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1890
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1890
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations