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On the variability of the low-frequency noise in UTBOX SOI nMOSFETs

Date

2013
Journal article
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorAndrade, Maria Gloria
dc.contributor.authorMendes Almeida, Luciano
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCaillat, Christian
dc.contributor.authorJurczak, Gosia
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-21T12:04:19Z
dc.date.available2021-10-21T12:04:19Z
dc.date.issued2013
dc.identifier.issn1807-1953
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23084
dc.source.beginpage71
dc.source.endpage77
dc.source.issue2
dc.source.journalJournal of Integrated Circuits and Systems
dc.source.volume8
dc.title

On the variability of the low-frequency noise in UTBOX SOI nMOSFETs

dc.typeJournal article
dspace.entity.typePublication
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