Publication:

Bidirectional NPN ESD protection in silicon photonics technology

Date

2016
Meeting abstract
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dc.contributor.authorBoschke, Roman
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorHellings, Geert
dc.contributor.authorScholz, Mirko
dc.contributor.authorDe Heyn, Vincent
dc.contributor.authorVerheyen, Peter
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThean, Aaron
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorDe Heyn, Vincent
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-23T10:09:18Z
dc.date.available2021-10-23T10:09:18Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26368
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7574520
dc.source.beginpage1
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate17/04/2016
dc.source.conferencelocationPasadena, CA USA
dc.source.endpage7
dc.title

Bidirectional NPN ESD protection in silicon photonics technology

dc.typeMeeting abstract
dspace.entity.typePublication
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