Modeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedure

dc.contributor.author	Van Heijningen, Marc
dc.contributor.author	Vandamme, Ewout
dc.contributor.author	Deferm, Ludo
dc.contributor.author	Vandamme, Lorenz
dc.contributor.imecauthor	Deferm, Ludo
dc.date.accessioned	2021-10-01T09:16:54Z
dc.date.available	2021-10-01T09:16:54Z
dc.date.issued	1998
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/3042
dc.source.beginpage	468
dc.source.conference	Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France.
dc.source.conferencelocation
dc.source.endpage	471
dc.title	Modeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedure
dc.type	Proceedings paper
dspace.entity.type	Publication
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