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Sources of overlay error in double patterning integration schemes
Publication:
Sources of overlay error in double patterning integration schemes
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Laidler, David
;
Leray, Philippe
;
D'have, Koen
;
Cheng, Shaunee
Journal
Semiconductor Fabtech
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1844
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Acq. date: 2025-12-15
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Metrics
Views
1844
since deposited on 2021-10-17
3
last month
2
last week
Acq. date: 2025-12-15
Citations