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pMOSFET off-state leakage and junction leakage current in Ge-based devices
Publication:
pMOSFET off-state leakage and junction leakage current in Ge-based devices
Date
2009
Proceedings Paper
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18909.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
De Stefano, Francesca
;
Eneman, Geert
;
De Jaeger, Brice
;
Claeys, Cor
;
Crupi, F.
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1929
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Acq. date: 2025-12-08
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Views
1929
since deposited on 2021-10-18
2
last month
1
last week
Acq. date: 2025-12-08
Citations