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Determination of the TE- and TM-mode reflectivity at a laser facet using perfectly matched layers

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dc.contributor.authorDerudder, H.
dc.contributor.authorOlyslager, Frank
dc.contributor.authorDe Zutter, Daniel
dc.contributor.imecauthorDe Zutter, Daniel
dc.date.accessioned2021-09-30T11:50:51Z
dc.date.available2021-09-30T11:50:51Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2542
dc.source.beginpage113
dc.source.conferenceProceedings 3rd Annual Symposium of the IEEE/LEOS Benelux Chapter
dc.source.conferencedate26/11/1998
dc.source.conferencelocationGent Belgium
dc.source.endpage116
dc.title

Determination of the TE- and TM-mode reflectivity at a laser facet using perfectly matched layers

dc.typeProceedings paper
dspace.entity.typePublication
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