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Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability

Date

2013
Proceedings Paper
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dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorWeckx, Pieter
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-21T07:41:26Z
dc.date.available2021-10-21T07:41:26Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22361
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6804161
dc.source.beginpage69
dc.source.conferenceIEEE International Integrated Reliability Workshop - IIRW
dc.source.conferencedate13/10/2013
dc.source.conferencelocationSouth Lake Tahoe, CA USA
dc.source.endpage72
dc.title

Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability

dc.typeProceedings paper
dspace.entity.typePublication
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